Anomalous bias-stress-induced unstable phenomena of InZnO thin-film transistors using Ta 2 O 5 gate dielectric

✍ Scribed by Xu, Wangying; Dai, Mingzhi; Liang, Lingyan; Liu, Zhimin; Sun, Xilian; Wan, Qing; Cao, Hongtao

• Book ID: 126694937
• Publisher: Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 593 KB
• Volume: 45
• Category: Article
• ISSN: 0022-3727
• DOI: 10.1088/0022-3727/45/20/205103