Annealing studies of fast ion conducting glasses by FTIR microscopy
โ Scribed by C. Julien; M. Massot
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 339 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0167-2738
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๐ SIMILAR VOLUMES
Varying formers compositions of fast ionic conducting silveraresenotellurate (SAT) quaternary glasses were prepared by melt quenching technique. X-ray diffraction (XRD) measurements were carried out and confirmed the glassy nature of all SAT samples from the observed peak free XRD spectra. Fourier t
Ion implantation of 20 keV 12 C + ions into (1 0 0), p-type silicon with ion fluence of 8 โข 10 16 at. cm ร2 followed by an electron beam annealing under high vacuum conditions has been performed to investigate the formation of crystalline nano-scale SiC features on the silicon surface. Depending on