✦ LIBER ✦
Annealing of total dose damage: redistribution of interface state density on [100], [110] and [111] orientation silicon
✍ Scribed by Stahlbush, R.E.; Lawrence, R.K.; Hughes, H.L.; Saks, N.S.
- Book ID
- 114554578
- Publisher
- IEEE
- Year
- 1988
- Tongue
- English
- Weight
- 565 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0018-9499
- DOI
- 10.1109/23.25438
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