Annealing of the radiation damage in Mg-implanted GaN thin films: Temperature development of lattice parameters and stresses

✍ Scribed by J. Keckes; A. Wenzel; J.W. Gerlach; B. Rauschenbach

• Book ID: 114167519
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 376 KB
• Volume: 211
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(03)01419-8