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Annealing of radiation induced oxygen deficient point defects in amorphous silicon dioxide: evidence for a distribution of the reaction activation energies

✍ Scribed by Nuccio, L; Agnello, S; Boscaino, R


Book ID
127271919
Publisher
Institute of Physics
Year
2008
Tongue
English
Weight
480 KB
Volume
20
Category
Article
ISSN
0953-8984

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