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Annealing of damage in Se+-implanted indium phosphide : J. D. Woodhouse, J. P. Donnelly, P. M. Nitishin, E. B. Owens and J. L. Ryan. Solid-St. Electron. 27, 677 (1984)


Book ID
103279290
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
133 KB
Volume
25
Category
Article
ISSN
0026-2714

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