✦ LIBER ✦
Annealing Induced Dissipation of Residual Trapped Charge in Focused Ion Beam Processed Wide Band Gap Materials for Device Applications.
✍ Scribed by Stevens-Kalceff, MA; Gowlett, P
- Book ID
- 120027017
- Publisher
- Cambridge University Press
- Year
- 2006
- Tongue
- English
- Weight
- 121 KB
- Volume
- 12
- Category
- Article
- ISSN
- 1431-9276
No coin nor oath required. For personal study only.