Annealing effects in plated-wire memory elements, part I: Interdiffusion of copper and permalloy

✍ Scribed by Knudson, C.; Kench, J.

• Book ID: 117921673
• Publisher: IEEE
• Year: 1971
• Tongue: English
• Weight: 1022 KB
• Volume: 7
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.1971.1067241