Scanning tunneling microscopy/spectrosco
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A. Sugimoto; K. Shohara; T. Ekino; Y. Watanabe; Y. Harada; S. Mikusu; K. Tokiwa;
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Article
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2009
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Elsevier Science
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English
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Scanning tunneling microscopy/spectroscopy (STM/STS) measurements on multi-layered cuprate superconductor Ba 2 Ca 5 Cu 6 O 12 (O 1รx F x ) 2 are carried out. STM topographies show randomly distributed bright spot structures with a typical spot size of $0.8 nm. These bright spots are occupied about 2