Annealing behavior comparison of NTD FZ (H) Si irradiated in light-water-reactor and heavy-water-reactor

✍ Scribed by Huaixiang Li; Ruihua Wang; Hua Zhang; Jing Zhao; Guirong Liu; Yansheng Chen; Shuzhen Duan

• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 116 KB
• Volume: 107
• Category: Article
• ISSN: 0921-5107
• DOI: 10.1016/j.mseb.2003.10.076