Anisotropy in metallic thin films patterned by the atomic saw method

✍ Scribed by H Jaffrès; L Ressier; F Michelini; D Chandesris; P Le Fèvre; H Magnan; J.L Gauffier; R Mamy; M Goiran; J.P Peyrade; J.F Bobo; J.C Ousset; J.P Redoulès; D Bertrand; A.R Fert

• Book ID: 114230042
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 179 KB
• Volume: 203
• Category: Article
• ISSN: 0304-8853
• DOI: 10.1016/s0304-8853(99)00212-7