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Anelastic and dielectric relaxations in CuO in the temperature range 90–160 K

✍ Scribed by H. M. Shen; Z. F. Zhang; P. S. Guo; Y. N. Huang; Y. N. Wang

Publisher: Springer US
Year: 1994
Tongue: English
Weight: 247 KB
Volume: 96
Category: Article
ISSN: 0022-2291
DOI: 10.1007/bf00754744

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