Analyzer-based X-ray phase contrast imaging with four bounce Si(444) monochromators at ELETTRA
✍ Scribed by Hönnicke, M. G. ;Rigon, L. ;Arfelli, F. ;Menk, R.-H. ;Cusatis, C.
- Book ID
- 105364354
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 362 KB
- Volume
- 204
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
Abstract
An analyzer‐based X‐ray phase contrast imaging setup (ABI) based on four bounce Si(444) monochromators at 18 keV mounted at the SYRMEP beamline at Elettra is presented. The system was stable for the employed exposure times. Contrasts, visibility of the object edges and signal to noise ratio of the acquired images were studied. Simulation procedures of the images were also exploited. The results show that such setup can be used for high sensitivity (high contrast) experiments at Elettra. Also, due to intrinsic properties, this setup can be useful for future ultra‐small angle X‐ray scattering experiments. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)