𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Analytical theory for flexo-electric domains in nematic layers

✍ Scribed by Dr. P. Schiller; Dr. sc. G. Pelzl; Prof. D. Demus


Book ID
102132837
Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
246 KB
Volume
25
Category
Article
ISSN
0232-1300

No coin nor oath required. For personal study only.

✦ Synopsis


An analytical theory for flexo-electric domains in planar nematic films with positive dielectric anisotropy is proposed. It can be decided by a simple criterion, whether flexoelectric domains or the ordinary Fredericksz transition will occur.

Es wird eine analytische Theorie fur flexoelektrische Domanen in planar orientierten nematischen Filmen mit positiver dielektrischer Anisotropie vorgeschlagen. Mit Hilfe eines einfachen Kriteriums kann entschieden werden, ob flexoelektrische Domanen auftreten oder ob eine Freedericksz-Umlagerung stattfindet.


πŸ“œ SIMILAR VOLUMES


Analytical solution in 2D domain for non
✍ M.K. Samal; P. Seshu πŸ“‚ Article πŸ“… 2009 πŸ› Elsevier Science 🌐 English βš– 714 KB

Piezoceramic materials exhibit different types of nonlinearities depending upon the magnitude of the mechanical and electric field strength in the continuum. Some of the nonlinearities observed under weak electric fields are: presence of superharmonics in the response spectra and jump phenomena etc.

A Simple Algorithm for Calculating Elect
✍ Derek Y.C. Chan πŸ“‚ Article πŸ“… 2002 πŸ› Elsevier Science 🌐 English βš– 75 KB

A simple, general, and numerically robust algorithm is presented for calculating the disjoining pressure and interaction free energy per unit area between two identically charged flat plates due to electrical double layer interactions according to the nonlinear Poisson-Boltzmann theory. The result i

An alternative analytical reduction sche
✍ Houle Gan; Dan Jiao πŸ“‚ Article πŸ“… 2008 πŸ› John Wiley and Sons 🌐 English βš– 449 KB πŸ‘ 1 views

## Abstract An alternative analytical reduction scheme was proposed in the time‐domain layered finite element reduction recovery (LAFE‐RR) method for the analysis of high‐frequency integrated circuits. This alternative reduction scheme permits the use of general absorbing boundary conditions in the