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Analytical modeling of surface accumulation behavior of fully depleted SOI four gate transistors (G4-FETs)

✍ Scribed by Sayed, Shehrin; Khan, M. Ziaur Rahman

Book ID: 123582830
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 775 KB
Volume: 81
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2012.12.004

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