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Analytical method for evaluating surface charge distribution on a dielectric from capacitive probe measurement-application to a cone-type spacer in +or-500 kV DC-GIS
✍ Scribed by Ootera, H.; Nakanishi, K.
- Book ID
- 119965783
- Publisher
- IEEE
- Year
- 1988
- Tongue
- English
- Weight
- 747 KB
- Volume
- 3
- Category
- Article
- ISSN
- 0885-8977
- DOI
- 10.1109/61.4242
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