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Analytical description of z-scan on-axis intensity based on the Huygens–Fresnel principle

✍ Scribed by Samad, Ricardo Elgul; Dias Vieira, Jr., Nilson


Book ID
115395688
Publisher
Optical Society of America
Year
1998
Tongue
English
Weight
228 KB
Volume
15
Category
Article
ISSN
0740-3224

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