Analytical description of the injection ratio of self-biased bipolar transistors under the very high injection conditions of ESD events

✍ Scribed by A. Gendron; P. Renaud; M. Bafleur; N. Nolhier

• Book ID: 108271637
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 932 KB
• Volume: 52
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2007.11.011