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Analytical characterization of thin carbon films

✍ Scribed by R. Ohr; C. Schug; M. Wahl; A. Wienss; H. Hilgers; J. Mahrholz; P. Willich; T. Jung

Book ID: 105887981
Publisher: Springer
Year: 2003
Tongue: English
Weight: 216 KB
Volume: 375
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s00216-002-1667-2

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