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Analytic model for the efficiency droop in semiconductors with asymmetric carrier-transport properties based on drift-induced reduction of injection efficiency

✍ Scribed by Lin, Guan-Bo; Meyaard, David; Cho, Jaehee; Fred Schubert, E.; Shim, Hyunwook; Sone, Cheolsoo


Book ID
120041431
Publisher
American Institute of Physics
Year
2012
Tongue
English
Weight
935 KB
Volume
100
Category
Article
ISSN
0003-6951

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