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Analytic inversion formula for confocal scanning microscopy

✍ Scribed by Bertero, B.; De Mol, C.; Pike, E. R.


Book ID
115386415
Publisher
Optical Society of America
Year
1987
Tongue
English
Weight
289 KB
Volume
4
Category
Article
ISSN
1084-7529

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A scanning electron microscope of ultra-high-vacuum (UHV-SEM) with a field emission gun (FEG) is operated at the primary electron energies of from 100 eV to 3 keV. The instrument can form the images that contain information on surface chemical composition, chemical bonding state (electronic structur