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Analysis on accuracy of charge-pumping measurement with gate sawtooth pulses [MOSFETs]

✍ Scribed by Lai, P.T.; Xu, J.P.; Poek, C.K.; Cheng, Y.C.


Book ID
114537247
Publisher
IEEE
Year
1998
Tongue
English
Weight
201 KB
Volume
45
Category
Article
ISSN
0018-9383

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