✦ LIBER ✦
Analysis of width edge effects in advanced isolation schemes for deep submicron CMOS technologies
✍ Scribed by Sallagoity, P.; Ada-Hanifi, M.; Paoli, M.; Haond, M.
- Book ID
- 114536612
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 768 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0018-9383
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