✦ LIBER ✦
Analysis of trap effect on reliability using the charge pumping technology in La-incorporated high-k dielectrics
✍ Scribed by Hyuk-Min Kwon; Won-Ho Choi; In-Shik Han; Sang-Uk Park; Byoung-Seok Park; Ying-Ying Zhang; Chang-Yong Kang; Byoung-Hun Lee; Raj Jammy; Hi-Deok Lee
- Book ID
- 113797726
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 550 KB
- Volume
- 88
- Category
- Article
- ISSN
- 0167-9317
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