Analysis of threading dislocations in void shape controlled GaN re-grown on hexagonally patterned mask-less GaN

✍ Scribed by M. Ali; A.E. Romanov; S. Suihkonen; O. Svensk; S. Sintonen; M. Sopanen; H. Lipsanen; V.N. Nevedomsky; N.A. Bert; M.A. Odnoblyudov; V.E. Bougrov

• Book ID: 116630226
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 676 KB
• Volume: 344
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/j.jcrysgro.2012.01.047