✦ LIBER ✦
Analysis of thin oxide films on silicon by back-scattering techniques : Ion Beam Analysis Group (Shanghai Institute of Metallurgy and Shanghai Institute of Nuclear Research). Int. J. Electron.46, (5) 513 (1979)
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 50 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0026-2714
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