Analysis of the static stress field around faults lying along and intersecting a bimaterial interface

✍ Scribed by Shiro Hirano; Teruo Yamashita

• Book ID: 108753593
• Publisher: John Wiley and Sons
• Year: 2011
• Tongue: English
• Weight: 843 KB
• Volume: 187
• Category: Article
• ISSN: 0956-540X
• DOI: 10.1111/j.1365-246x.2011.05202.x