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Analysis of the short-term DC-current gain variation during high current density-low temperature stress of AlGaAs/GaAs heterojunction bipolar transistors

✍ Scribed by Bovolon, N.; Schultheis, R.; Muller, J.-E.; Zwicknagl, P.


Book ID
114538020
Publisher
IEEE
Year
2000
Tongue
English
Weight
253 KB
Volume
47
Category
Article
ISSN
0018-9383

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