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Analysis of the rate of change of inversion charge in thin insulator p-type Metal-Oxide-Semiconductor structures

✍ Scribed by Mingzhen Xu; Changhua Tan; Yandong He; Yangyuan Wang

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 396 KB
Volume: 38
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(95)98673-q

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