This article describes the quasistatic analysis of a shielded microstripline with finite metallization thickness penetrating into the anisotropic substrate. A vertical directional mode-matching method, which includes eigenfunctions with inhomogeneous properties for analyzing this structure, has been
Analysis of the mixing effect in InAlAs/InGaAs metal-semiconductor-metal photodetectors
✍ Scribed by K. Aliberti; B. Stann; S. Svensson; R. Mehandru; F. Ren; H. Shen
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 116 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0895-2477
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✦ Synopsis
Abstract
The optoelectronic mixing effect in InAlAs Schottky‐enhanced InGaAs‐based metal‐semiconductor‐metal photodetectors (MSM‐PDs) is analyzed. The measured frequency bandwidth of the optoelectronic mixer (OEM) is less than that of a corresponding photodetector. The mixing efficiency depends on the light‐modulation, local‐oscillator, and mixed‐signal frequencies and decreases nonlinearly with a decrease in optical power. We present a circuit model of the OEM to explain the experimental results. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 39: 108–112, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11141
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