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Analysis of the latch and breakdown phenomena in N and P channel thin film SOI MOSFET's as a function of temperature

✍ Scribed by Balestra, F.; Jomaah, J.; Ghibaudo, G.; Faynot, O.; Auberton-Herve, A.J.; Giffard, B.


Book ID
114535574
Publisher
IEEE
Year
1994
Tongue
English
Weight
388 KB
Volume
41
Category
Article
ISSN
0018-9383

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