In-line' or 'process' specification limits are used in semiconductor manufacturing processes to provide some level of assurance for the functional performance of product measured at functional testing or probe. However, these limits are not always set in a rigorous manner and may not prove to be an
Analysis of the Gibbs sampler for a model related to James-Stein estimators
β Scribed by Jeffrey S. Rosenthal
- Publisher
- Springer US
- Year
- 1996
- Tongue
- English
- Weight
- 604 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0960-3174
No coin nor oath required. For personal study only.
β¦ Synopsis
We analyse a hierarchical Bayes model which is related to the usual empirical Bayes formulation of James-Stein estimators. We consider running a Gibbs sampler on this model. Using previous results about convergence rates of Markov chains, we provide rigorous, numerical, reasonable bounds on the running time of the Gibbs sampler, for a suitable range of prior distributions. We apply these results to baseball data from . For a different range of prior distributions, we prove that the Gibbs sampler will fail to converge, and use this information to prove that in this case the associated posterior distribution is non-normalizable.
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