✦ LIBER ✦
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime
✍ Scribed by Antonio Raffo; Sergio Di Falco; Giovanna Sozzi; Roberto Menozzi; Dominique M. M.-P. Schreurs; Giorgio Vannini
- Book ID
- 108210908
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 581 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0026-2714
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