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Analysis of the electronic structure of ultrathin NiO/Ag(100) films

✍ Scribed by I. O. Thomas; A. Fortunelli


Book ID
111623290
Publisher
Springer
Year
2010
Tongue
English
Weight
583 KB
Volume
75
Category
Article
ISSN
1434-6036

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The electronic structure of an oxygen defect in the NiO ( 100) surface is obtained from embedded N&OS and N&O, cluster models. No evidence of either Ni3+ , or metallic Ni" atoms associated with the defect is found. The peak at the higher binding energy ("Ni3+") in the Ni( 2p) XPS of Ar+-sputtered Ni