Analysis of the electronic and local structure of amorphous SiNx:H alloy films in terms of SiK, SiL, and NK x-ray emission bands

✍ Scribed by Wiech, G.; Šimůnek, A.

• Book ID: 115452931
• Publisher: The American Physical Society
• Year: 1994
• Tongue: English
• Weight: 455 KB
• Volume: 49
• Category: Article
• ISSN: 1098-0121
• DOI: 10.1103/physrevb.49.5398