✦ LIBER ✦
Analysis of the electron traps at the 4H-SiC/SiO2 interface using combined CV/thermally stimulated current measurements
✍ Scribed by T.E. Rudenko; H.Ö. Ólafsson; E.Ö. Sveinbjörnsson; I.P. Osiyuk; I.P. Tyagulski
- Book ID
- 108207321
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 233 KB
- Volume
- 72
- Category
- Article
- ISSN
- 0167-9317
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