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Analysis of the electrical breakdown in hydrogenated amorphous silicon thin-film transistors

โœ Scribed by Golo, N.T.; Kuper, F.G.; Mouthaan, T.J.


Book ID
114616738
Publisher
IEEE
Year
2002
Tongue
English
Weight
392 KB
Volume
49
Category
Article
ISSN
0018-9383

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