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Analysis of the Effective Refractive Index of Silicon Waveguides Through the Constructive and Destructive Interference in a Mach–Zehnder Interferometer

✍ Scribed by Dattner, Y.; Yadid-Pecht, O.


Book ID
114563861
Publisher
Institute of Electrical and Electronics Engineers
Year
2011
Tongue
English
Weight
1012 KB
Volume
3
Category
Article
ISSN
1943-0655

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