𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Analysis of the effect of phase noise in OFDM systems

✍ Scribed by Tomba, Luciano


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
813 KB
Volume
9
Category
Article
ISSN
1124-318X

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Analysis of the narrowband interference
✍ Marey, Mohamed ;Steendam, Heidi πŸ“‚ Article πŸ“… 2009 πŸ› John Wiley and Sons 🌐 English βš– 519 KB

## Abstract In orthogonal frequency division multiplexed (OFDM) systems affected by carrier frequency offsets, frequency ambiguity resolution, i.e. the estimation of the part of the frequency offset corresponding to an integer times the carrier spacing is a crucial issue. The proper action of frequ

Analysis of Doppler Spread Perturbations
✍ Robertson, Patrick ;Kaiser, Stefan πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 682 KB

## Abstract We analyze the effects of Doppler spread in mobile channels on Orthogonal Frequency Division Multiplex (OFDM) systems. This is important, since channel variations during one OFDM symbol cause Inter Sub‐carrier Interference (ICI) in OFDM systems, which degrades the performance, since ICI

Joint compensation of IQ imbalance, freq
✍ Tubbax, Jan ;Van der Perre, Liesbet ;Donnay, StΓ©phane ;Engels, Marc ;Moonen, Mar πŸ“‚ Article πŸ“… 2004 πŸ› John Wiley and Sons 🌐 English βš– 205 KB

## Abstract Zero‐IF receivers are getting a lot of attention because of their potential to enable low‐cost OFDM terminals. However, zero‐IF receivers also introduce IQ imbalance which can have a huge impact on the performance. Rather than increasing component cost to decrease the IQ imbalance, an a

Analysis of multiwavelength OOCDMA syste
✍ K. Murugesan; V. C. Ravichandran πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 160 KB

These results show that the measured phase tracks the designed phase, and the assumption of 45Њ maximum phase error used in the radiation pattern yield analysis is reasonable. ## Conclusions The design, development, and testing of an X-band 137-element passive reflect array capable of incorporatin