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Analysis of the edge region photocapacitance at constant bias in Te-doped Al0.55Ga0.45As

✍ Scribed by J.R. Morante; J. Samitier; A. Herms; A. Cornet; P. Cartujo

No coin nor oath required. For personal study only.

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Analysis of the x-ray resonant scatterin

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✍ Bertelrud, Arild; Graves, Sharon 📂 Article 📅 1994 🏛 American Institute of Aeronautics and Astronautics ⚖ 716 KB