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Analysis of the displacement field of a moving dislocation in a crystal

✍ Scribed by V. Celli; N. Flytzanis; S. Crowley


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
988 KB
Volume
37
Category
Article
ISSN
0022-3697

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An improved moire interferometry was used to record simultaneously both the vertical and horizontal displacements associated with stable crack growth in uniaxially and biaxially loaded 2024-O and 2024-T3 aluminum, single edge notched specimens. For stable crack growth up to 5 mm, the vertical displa