Analysis of the 3-dimensional electron distribution in silicon using directional Compton profile measurements

✍ Scribed by N. K. Hansen; P. Pattison; J. R. Schneider

• Book ID: 112511968
• Publisher: Springer
• Year: 1987
• Tongue: English
• Weight: 936 KB
• Volume: 66
• Category: Article
• ISSN: 1434-6036
• DOI: 10.1007/bf01305420