✦ LIBER ✦
Analysis of temperature-induced saturation threshold voltage degradation in deep-submicrometer ultrathin SOI MOSFETs
✍ Scribed by Pavanello, M.A.; Martino, J.A.; Simoen, E.; Claeys, C.
- Book ID
- 114617983
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 536 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9383
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