Analysis of TAB inner lead fatigue in thermal cycle environments : KEVIN D. CLUFF. IEEE Transcations on Components, Packaging, and Manufacturing Technology, Part A, 18(1), 101 (March 1995)

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 111 KB
• Volume: 36
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(96)84388-5