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Analysis of structural chromosome changes and SCE after occupational long-term exposure to electric and magnetic fields from 380 kV-systems

✍ Scribed by M. Bauchinger; R. Hauf; E. Schmid; J. Dresp


Publisher
Springer-Verlag
Year
1981
Tongue
English
Weight
242 KB
Volume
19
Category
Article
ISSN
0301-634X

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