Analysis of step-stress accelerated-life-test data: a new approach : L. C. Tang, Y. S. Sun, T. N. Goh and H. L. Ong. IEEE Transactions on Reliability, 45 (1), 69 (1996)

• Book ID: 108362303
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 145 KB
• Volume: 37
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(97)87697-4