Analysis of shadow mask thermal deformation and prediction of beam landing shifts for color CRT

✍ Scribed by Kug Woon Kim; Nam Woong Kim; Dae-Jin Kang

• Book ID: 117871271
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 806 KB
• Volume: 44
• Category: Article
• ISSN: 0098-3063
• DOI: 10.1109/30.681963