Analysis of resistivity, hall effect, and magnetoresistance measurements of thin bismuth films by means of an anisotropic two-carrier model

✍ Scribed by Dillner, U.

• Publisher: John Wiley and Sons
• Year: 1983
• Tongue: English
• Weight: 377 KB
• Volume: 75
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210750125