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Analysis of Residue Integration Sampling With Improved Jitter Immunity

✍ Scribed by Taehwan Oh; Maghari, N.; Gubbins, D.; Un-Ku Moon


Book ID
114614345
Publisher
Institute of Electrical and Electronics Engineers
Year
2011
Tongue
English
Weight
578 KB
Volume
58
Category
Article
ISSN
1549-7747

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