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Analysis of plating grain size effect on whisker

✍ Scribed by Seung-Jung Shin; Jae-Jung Kim; Young Kap Son

Book ID: 107624737
Publisher: Springer-Verlag
Year: 2009
Tongue: English
Weight: 836 KB
Volume: 23
Category: Article
ISSN: 1738-494X
DOI: 10.1007/s12206-009-0720-x

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centers lends direct support to the conclusion of van den Bergc6) that "an absolute purity scale of metals cannot be based on the measurements of residual resistance of single crystals or polycrystalline wires".